Annual meeting of the AG Fractography at DVM/DGM

Annual meeting of the AG Fractography at DVM/DGM

Annual meeting of the AG Fractography in the DVM/DGM joint committee “Scanning Electron Microscopy in Materials Testing”

Fracture phenomena in metallic materials – vital and constructive discussions

 

For the 12th time the annual meeting of the Working Group Fractography in the DVM/DGM Joint Committee “Scanning Electron Microscopy in Materials Testing” took place at the Federal Institute for Materials Research (BAM). Our colleague Dr.-Ing. Benedikt Döbereiner has been representing us there for many years.

At this year’s meeting, representatives and specialists from all over Germany presented interesting topics of various fracture phenomena of metallic materials and discussed them lively in the auditorium. For its part, BAM presented, among other topics, the progress of the increasingly comprehensive fractography database. We would like to take this opportunity to express our special thanks to the BAM staff for their commitment!

In consinderation of our own activities and offers in the field of damage analysis and material analysis up to fracture mechanics, participation and discussions are an excellent opportunity to advance and further develop our internal development processes. We are looking forward to the next meeting next year.

The working group (AG) “Fractography” is assigned to the DVM working group “Scanning Electron Microscopy of Materials Testing” and is a division of the DVM/DGM. The working group is headed by the BAM Federal Institute for Materials Research and Testing. It was founded to maintain a active interdisciplinary exchange of information with companies and research institutes working in the field of fractography and damage analysis. One of the currently important goals of the working group is the creation of a database for fracture surfaces, which is used as a reference for fracture surface evaluation in damage cases.

You can find further valuable information under:

https://dvm-berlin.de/index.php/arbeitskreise/rasterelektronen-mikroskopie-der-materialpruefung